TAGARNO will once again attend SMTA International Electronics Exhibition. The exhibition is the perfect place to launch our brand new DXF overlay app, an app specifically developed for quality control in Electronics. With the app search bar, operators can type in a component name directly on the TAGARNO digital microscope and the app finds the component automatically. No more having to do it manually.
As always, all the TAGARNO microscopes will be available at the booth for a live demo. We will be more than happy to discuss your needs with you as we show you how the microscope other features and apps can help your business.